Since its creation in 2008, the International Initiative of X-Ray Fundamental Parameters has strived to become a bridge between academia and industry being active in quantitative x-ray analysis and related instrument manufacturing. National metrology institutes and research centers, where metrology grade experiments and calculations are being developed, have paired with technological advanced partners in the R&D industry of X-ray methodologies. Indeed, X-ray measurements form the basis of an ever-increasing number of areas as varied as medical technology, renewable energy, semiconductor and nanotechnology fabrication, law enforcement and planetary exploration. However, pushing the limits of X-ray technology requires a critical assessment and evaluation of available data related to the interactions of X-rays with matter (“fundamental parameters” or FP).

One of the main challenges of the International Initiative on X-Ray Fundamental Parameters is the integration of the new, state-of-the-art results obtained within this framework, into critically evaluated compilations. Thus, the goal of this extra issue is to provide a platform to showcase all the high quality research being performed worldwide in the X-ray fundamental parameters field.

(Burkhard Beckhoff e Marie-Christine Lépy (ed.).

https://www.sciencedirect.com, 20.10.2021. Adaptado)